PANalytical X’Pert HighScore is a Windows-based software package for analyzing X-ray powder diffraction (XRD) data, developed by PANalytical B.V. It streamlines phase identification and quantitative analysis for research, industry, and quality control. The software offers robust pattern processing tools—including background modeling, Kα2 stripping, smoothing, peak detection, and profile fitting—along with powerful search–match capabilities against major crystallographic databases such as ICDD PDF-2/PDF-4+ and the Crystallography Open Database.
HighScore supports qualitative phase identification, lattice-parameter refinement, and crystallite size/strain estimation, and it produces clear, customizable reports. For advanced workflows, the optional HighScore Plus module adds full-profile methods such as Rietveld refinement and quantitative phase analysis using internal or external standards. The software supports batch processing for high-throughput studies, reads a wide range of industry-standard file formats (including PANalytical’s XRDML), and integrates smoothly with PANalytical diffractometers.
With an intuitive interface, context-aware tools, and flexible templates, X’Pert HighScore helps both new and experienced users achieve accurate, reproducible results in materials science, pharmaceuticals, geology, metallurgy, and beyond.
PANalytical XPert HighScore is developed by PANalytical B.V.. The most popular versions of this product among our users are: 1.0, 2.0, 2.1 and 2.2. The name of the program executable file is HELP.exe.
Comments